Fogorvosi szemle, 2003 (96. évfolyam, 1-6. szám)
2003-10-01 / 5. szám
FOGORVOSI SZEMLE ■ 96. évf. 5. sz. 2003. 203 DR Suba Cs, DR Velich N, Vida Gy, Kovács L, DR Kiss G, DR Szabó Gy: Secondary ion mass spectroscopic and X-r^ photoelectron spectroscopic study of the surface of titanium implants coated with anodic titanium layer The demands that must be satisfied by titanium implants applied in medical practice include chemical and physical durability. An anodic oxide protective layer formed on the surface of titanium implants serves for the better attainment of this aim. The composition of the passivizing layer and the changes in its thickness and binding state can be studied by method of material science, e.g. by secondary ion mass spectroscopy (SIMS) and X-ray photoelectron spectroscopy (XPS). In this way a possibility arises for the material technological classification of the Ti-Ti02 layer structure and for the observation of the physical and chemical reactions that occur between the implants and the tissues in the organism. The present XPS examinations revealed that the binding state of the titanium forming the surface of the plates involve neither significant quantities of titanium oxide nor impurities. In the SIMS investigation the thickness of the titanium oxide layer was found to be 120-150 nm. Determination of the thickness of the surface, the binding state of the titanium and the exact proportions of the impurities and additives furnishes a possibility for a subsequent comparison with the surface structure of plates removed from the organism. It is important for the assessment of the practical value of he protective layer. Key words: surface properties, surface treatment, anodic oxidation, XPS, SIMS
